Intel Graphics System Controller Firmware Update Library
Intel Graphics System Controller Firmware Update Library
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IGSC_IFR_RUN_TEST_STATUSES

Topics

 Gsfp

Data Structures

struct  igsc_device_mbist_ppr_status
struct  igsc_ppr_status

Enumerations

enum  igsc_ppr_test_status_mask { IGSC_PPR_STATUS_TEST_EXECUTED_MASK = 0x1 , IGSC_PPR_STATUS_TEST_SUCCESS_MASK = 0x2 , IGSC_PPR_STATUS_FOUND_HW_ERROR_MASK = 0x4 , IGSC_PPR_STATUS_HW_ERROR_REPAIRED_MASK = 0x8 }

Functions

IGSC_EXPORT int igsc_memory_ppr_devices (IN struct igsc_device_handle *handle, OUT uint32_t *device_count)
 Retrieves GFSP number of memory PPR devices.
IGSC_EXPORT int igsc_memory_ppr_status (IN struct igsc_device_handle *handle, OUT struct igsc_ppr_status *ppr_status)
 Retrieves GFSP memory PPR status structure data.

IGSC_IFR_RUN_TEST_STATUSES

The IFR Run Test Command Statuses

enum  ifr_test_run_status {
  IFR_TEST_STATUS_SUCCESS = 0 , IFR_TEST_STATUS_PASSED_WITH_REPAIR , IFR_TEST_STATUS_PASSED_WITH_RECOVERY , IFR_TEST_STATUS_SUBSLICE_FAILURE ,
  IFR_TEST_STATUS_NON_SUBSLICE_FAILURE , IFR_TEST_STATUS_ERROR
}
IGSC_EXPORT int igsc_ifr_get_status (IN struct igsc_device_handle *handle, OUT uint8_t *result, OUT uint32_t *supported_tests, OUT uint32_t *ifr_applied, OUT uint8_t *tiles_num)
 Retrieves the status of GSC IFR device.
IGSC_EXPORT int igsc_ifr_run_test (IN struct igsc_device_handle *handle, IN uint8_t test_type, IN uint8_t tiles, OUT uint8_t *result, OUT uint8_t *run_status, OUT uint32_t *error_code)
 Runs IFR test on GSC IFR device.

Detailed Description


Data Structure Documentation

◆ igsc_device_mbist_ppr_status

struct igsc_device_mbist_ppr_status

Device PPR status structure

Definition at line 1739 of file igsc_lib.h.

Data Fields
uint32_t mbist_test_status

0 – Pass, Any set bit represents that MBIST on the matching channel has failed

uint32_t num_of_ppr_fuses_used_by_fw

Number of PPR fuses used by the firmware

uint32_t num_of_remaining_ppr_fuses

Number of remaining PPR fuses

◆ igsc_ppr_status

struct igsc_ppr_status

PPR status structure

Definition at line 1748 of file igsc_lib.h.

Data Fields
uint8_t boot_time_memory_correction_pending

0 - No pending boot time memory correction, 1 - Pending boot time memory correction

struct igsc_device_mbist_ppr_status device_mbist_ppr_status[]

Array of PPR statuses per device

uint32_t mbist_completed

0 - Not Applied, Any set bit represents mbist completed

uint32_t num_devices

real number of devices in the array (on Xe_HP SDV, PVC <= 8)

uint8_t ppr_mode

0 – PPR enabled, 1 – PPR disabled, 2 – PPR test mode, 3 – PPR auto run on next boot

uint32_t ras_ppr_applied

0 - ppr not applied, 1 - ppr applied, 2 - ppr exhausted

uint8_t reserved
uint8_t test_run_status

test status

See also
enum igsc_ppr_test_status_mask

Enumeration Type Documentation

◆ ifr_test_run_status

Enumerator
IFR_TEST_STATUS_SUCCESS 

Test passed successfully

IFR_TEST_STATUS_PASSED_WITH_REPAIR 

Test passed, recoverable error found and repaired. No subslice swap needed

IFR_TEST_STATUS_PASSED_WITH_RECOVERY 

Test passed, recoverable error found and repaired. Subslice swap needed.

IFR_TEST_STATUS_SUBSLICE_FAILURE 

Test completed, unrecoverable error found (Subslice failure and no spare Subslice available).

IFR_TEST_STATUS_NON_SUBSLICE_FAILURE 

Test completed, unrecoverable error found (non-Subslice failure).

IFR_TEST_STATUS_ERROR 

Test error

Definition at line 1275 of file igsc_lib.h.

◆ igsc_ppr_test_status_mask

memory PPR status structures PPR test status bit masks

Definition at line 1729 of file igsc_lib.h.

Function Documentation

◆ igsc_ifr_get_status()

IGSC_EXPORT int igsc_ifr_get_status ( IN struct igsc_device_handle * handle,
OUT uint8_t * result,
OUT uint32_t * supported_tests,
OUT uint32_t * ifr_applied,
OUT uint8_t * tiles_num )

Retrieves the status of GSC IFR device.

Parameters
handleA handle to the device.
resultTest result code
supported_testsBitmask holding the tests supported on the platform.
ifr_appliedBitmask holding the in field repairs was applied during boot.
tiles_numNumber of tiles on the specific SOC.
Returns
IGSC_SUCCESS if successful, otherwise error code.

◆ igsc_ifr_run_test()

IGSC_EXPORT int igsc_ifr_run_test ( IN struct igsc_device_handle * handle,
IN uint8_t test_type,
IN uint8_t tiles,
OUT uint8_t * result,
OUT uint8_t * run_status,
OUT uint32_t * error_code )

Runs IFR test on GSC IFR device.

Parameters
handleA handle to the device.
test_typeRequested test to run
resultTest result code
tilesTiles on which to run the test
run_statusTest run status
error_codeThe error code of the test that was run (0 - no error)
Returns
IGSC_SUCCESS if successful, otherwise error code.

◆ igsc_memory_ppr_devices()

IGSC_EXPORT int igsc_memory_ppr_devices ( IN struct igsc_device_handle * handle,
OUT uint32_t * device_count )

Retrieves GFSP number of memory PPR devices.

Parameters
handleA handle to the device.
countpointer to number of memory PPR devices, the number is returned by the FW
Returns
IGSC_SUCCESS if successful, otherwise error code.

◆ igsc_memory_ppr_status()

IGSC_EXPORT int igsc_memory_ppr_status ( IN struct igsc_device_handle * handle,
OUT struct igsc_ppr_status * ppr_status )

Retrieves GFSP memory PPR status structure data.

Parameters
handleA handle to the device.
ppr_statuspointer to PPR status structure, which contains num_devices field representing the number of allocated items in the device_mbist_ppr_status[] array.
Returns
IGSC_SUCCESS if successful, otherwise error code.